Time-Dependent Electrical Contact Resistance at the Nanoscale

Abstract Conductive-atomic force microscopy (C-AFM) and molecular dynamics (MD) simulations are used to investigate time-dependent electrical contact resistance (ECR) at the nanoscale. ECR is shown decrease over time as measured using C-AFM estimated two approaches from MD simulations, although experiments explore different scales. The show that dependence of attributable an increase in real area due atoms diffusing into contact. This diffusion-based aging found be a thermally activated process depends on local pressure. results demonstrate aging, previously identified important mechanism for friction, can significantly affect conduction Graphical